Investigation of Defects in CZT Single Crystals

Yaşar, Bengisu
Kabukçuoğlu, Merve
Ergunt, Yasin
Parlak, Mehmet
Turan, Raşit
Kalay, Yunus Eren
The II-IV compound semiconductor CZT single crystal is a highly prominent material for the fabrication of various industrial applications such as gamma ray/X-ray detectors, electro-optic modulators and solar cells. Often, CZT single crystals suffer from various crystallographic defects emerged during crystal growth and post-growth cooling processes. In the scope of this research, the nano scale defects were investigated by using HRTEM. Single crystalline CZT crystals were grown using a three-zone vertical Bridgman system. Single crystals oriented along {111} and {211} crystals were rotated with the help of Laue Back Reflection method and cut with a diamond cutter. Tellurium precipitates, twins and stacking faults with the help of quantitative scanning transmission electron microscopy (QSTEM) simulation package and compare them with the experimentally observed HRTEM images. APT was used for the investigation of tellurium segregation. The quantitative interpretations of HRTEM along with corresponding simulations will be presented and discussed in details.
TMS 2017, (26 Şubat-02 Mart 2017)


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Citation Formats
B. Yaşar, M. Kabukçuoğlu, Y. Ergunt, M. Parlak, R. Turan, and Y. E. Kalay, “Investigation of Defects in CZT Single Crystals,” presented at the TMS 2017, (26 Şubat-02 Mart 2017), 2017, Accessed: 00, 2021. [Online]. Available: