Investigation of photocatalytic activities of vanadium silicate AM-6 thin films

Kuzyaka, Duygu
Galioğlu, Sezin
Altın, İ
Sökmen, Münevver
Akata Kurç, Burcu


Gullu, H. H.; Parlak, Mehmet (World Scientific Pub Co Pte Lt, 2020-01-01)
Zn-In-Se thin films were fabricated on the ultrasonically cleaned glass substrates masked with clover-shaped geometry by thermal evaporation of its elemental sources. Temperature-dependent conductivity characteristics of the films were investigated under dark and illuminated conditions. The semiconductor type of the films was found as n-type by thermal probe test. According to the van der Pauw technique, the dark electrical conductivity analyses showed that the variations of conductivity of unannealed and a...
Investigation of silver-induced crystallization of germanium thin films fabricated on different substrates
Kabacelik, Ismail; KULAKCI, MUSTAFA; Turan, Raşit (2015-06-01)
Silver-induced crystallizations of amorphous germanium (alpha-Ge) thin films were fabricated through electron beam evaporation on crystalline silicon (c-Si) (100), aluminum-doped zinc oxide (AZO), and glass substrates at room temperature. The solid-phase crystallization (SPC) of alpha-Ge films was investigated for various post-annealing temperatures between 300 and 500 degrees C for 60 min. Two crystallization approaches were compared: SPC and metal-induced crystallization (MIC). The structural properties o...
Investigation of optical parameters of thermally evaporated ZnSe thin films
Gullu, H. H.; Coşkun, Emre; Parlak, Mehmet (2015-04-29)
In this work, zinc selenide (ZnSe) thin films were deposited by thermal evaporation method using pure elemental (Zn and Se) sources. The physical properties of the films have been investigated in terms of the structural and optical characterizations depending on the post-annealing process under nitrogen atmosphere in the temperature between 300 and 500 degrees C for 30 min. The structural and compositional analyses were carried out by means of X-ray diffraction (XRD) and energy dispersive X-ray spectroscopy...
Investigation of perfluoropentacene thin films on substrates with different chemical structures
Yavuz, Adem; Danışman, M. Fatih.; Department of Micro and Nanotechnology (2020)
Due to their promising properties in electronic device applications, organic semiconductors (OSs) are being studied heavily. In this study, we aimed to investigate the structural properties of PerFluoroPentacene (PFP) thin films on flat and vicinal Au(111), and Ag(111) surfaces grown by the Supersonic Beam Deposition(SMBD) technique as a function of film thickness, metal surface step density, the effect of chemical and electronic properties of substrate, molecular flux (deposition rate), and energy during f...
Investigation of the electromagnetic properties of single walled carbon nanotube thin films
Küçükyıldız, Şeyda; Dericioğlu, Arcan Fehmi; Ünalan, Hüsnü Emrah; Department of Metallurgical and Materials Engineering (2013)
The work presented in this thesis can be divided in two parts. First part discusses the dispersion and deposition routes of single walled carbon nanotube (SWNT) thin films. Two different types of SWNTs and several dispersing agents were examined to achieve a homogeneous SWNT solution. A tip-sonicator and an ultrasonic bath was compared and it has been found that tip-sonicator increases the efficiency of SWNT dispersions. Vacuum filtration and spray coating techniques were utilized for the deposition of SWNT...
Citation Formats
D. Kuzyaka, S. Galioğlu, İ. Altın, M. Sökmen, and B. Akata Kurç, “Investigation of photocatalytic activities of vanadium silicate AM-6 thin films,” 2017, Accessed: 00, 2021. [Online]. Available: