Show/Hide Menu
Hide/Show Apps
Logout
Türkçe
Türkçe
Search
Search
Login
Login
OpenMETU
OpenMETU
About
About
Open Science Policy
Open Science Policy
Open Access Guideline
Open Access Guideline
Postgraduate Thesis Guideline
Postgraduate Thesis Guideline
Communities & Collections
Communities & Collections
Help
Help
Frequently Asked Questions
Frequently Asked Questions
Guides
Guides
Thesis submission
Thesis submission
MS without thesis term project submission
MS without thesis term project submission
Publication submission with DOI
Publication submission with DOI
Publication submission
Publication submission
Supporting Information
Supporting Information
General Information
General Information
Copyright, Embargo and License
Copyright, Embargo and License
Contact us
Contact us
Development of computer controlled deuterium lamp background correction atomic absorption spectrometer
Download
004073.pdf
Date
1988
Author
Toydemir, Şerife
Metadata
Show full item record
Item Usage Stats
68
views
0
downloads
Cite This
URI
https://hdl.handle.net/11511/8734
Collections
Graduate School of Natural and Applied Sciences, Thesis
Suggestions
OpenMETU
Core
Development of computer controlled Spectrofluorometer
Hamada, A. S. Moner; Gökmen, Ali; Department of Chemistry (1990)
Development of atomic force microscopy system and kelvin probe microscopy system for use in semiconductor nanocrystal characterization
Bostancı, Umut; Turan, Raşit; Department of Physics (2007)
Atomic Force Microscopy (AFM) and Kelvin Probe Microscopy (KPM) are two surface characterization methods suitable for semiconductor nanocrystal applications. In this thesis work, an AFM system with KPM capability was developed and implemented. It was observed that, the effect of electrostatic interaction of the probe cantilever with the sample can be significantly reduced by using higher order resonant modes for Kelvin force detection. Germanium nanocrystals were grown on silicon substrate using different g...
DEVELOPMENT OF SMALL SIZE UNCOOLED INFRARED MICROBOLOMETER PIXEL
Tekin, Baran utku; Akın, Tayfun; Turan, Raşit; Department of Micro and Nanotechnology (2021-9)
This thesis reports the development of 12 µm pixel pitch single layer microbolometer structures for use in the 8-12 µm wavelength regions, following recent trends in the last decade in microbolometers. Various pixel structures are designed, simulated, fabricated, and characterized to obtain acceptable detector performance in these small pixels. The pixel structures are improved by reducing the pixel thermal conductance and by using planar type electrode structures where the active material is selected as V...
Development of high performance uncooled infrared detector materials
Kebapçı, Başak; Akın, Tayfun; Turan, Raşit; Department of Micro and Nanotechnology (2011)
This thesis reports both the optimizations of the vanadium oxide (VOx) thin film as an active infrared detector material by the magnetron sputtering deposition method and its use during fabrication of proper resistors for the microbolometers. Vanadium oxide is a preferred material for microbolometers, as it provides high TCR value, low noise, and reasonable resistance, and a number of high-tech companies have used this material to obtain state-of-the-art microbolometer arrays. This material is first used in...
Development of a scintillation gamma-ray spectrometer
Akış, M. Cengiz; Özsan, F.Esen; Department of Nuclear Engineering (1989)
Citation Formats
IEEE
ACM
APA
CHICAGO
MLA
BibTeX
Ş. Toydemir, “Development of computer controlled deuterium lamp background correction atomic absorption spectrometer,” Middle East Technical University, 1988.