Investigation of material properties of magnetron sputtered CuAg-In-Se thin films

Date

2016-09-23

Author

Güllü, Hasan Hüseyin
Parlak, Mehmet

Metadata

Show full item record

Item Usage Stats

244
views

0
downloads

Thin films of copper based chalcopyrite absorber materials are attracting the attention of many researchers because of their favorable optoelectronic properties and good stability makes them suitable for photovoltaic and optoelectronic device applications. These compounds are particularly suitable for making p-n hetero-junctions with the II-VI compounds. Therefore, the utilization of I-III-VI2 group of chalcopyrite semiconductors has been reported in the literature for application in thin film solar cells. In this work, the quaternary structure Cu-Ag-In-Se (CAIS) that belongs to the ternary semiconducting I-III-VI2 materials family formed by occupying the Cu sites alternatively with Ag has been investigated. CAIS thin films were prepared by using a magnetron DC/RF sputtering system, and CIS and Ag targets were used in the deposition process of the CAIS thin films in stacked layer formation to get a homogenous film structure. In fact, the work has been particularly concentrated on the wire-shaped formations on the CAIS film surfaces for the forms of as-deposited and thermally annealed at different temperatures. The characterizations of the thin films were done by X-ray diffraction (XRD), and also scanning electron microscope (SEM) equipped with energy dispersive X-ray analysis (EDXA) detector facility. The surface characteristics were investigated by SEM measurements and the observed nanostructures were detailed. Moreover, the complementary characterization of the films includes transmission and reflection measurements for optical; room temperature resistivity measurements and temperature dependent conductivity for electrical analysis.

Subject Keywords

Thin film, Annealing, Nanostructure

URI

https://hdl.handle.net/11511/87619
http://www.satf2016.org/docs/ABSTRACT_BOOK-satf_2016.pdf

Conference Name

Science and Applications of Thin Films, Conference & Exhibition (SATF 2016) Izmir Institute of Technology, September 19-23, 2016

Collections

Department of Physics, Conference / Seminar

Suggestions

OpenMETU
Core

Investigation of perfluoropentacene thin films on substrates with different chemical structures Yavuz, Adem; Danışman, M. Fatih.; Department of Micro and Nanotechnology (2020) Due to their promising properties in electronic device applications, organic semiconductors (OSs) are being studied heavily. In this study, we aimed to investigate the structural properties of PerFluoroPentacene (PFP) thin films on flat and vicinal Au(111), and Ag(111) surfaces grown by the Supersonic Beam Deposition(SMBD) technique as a function of film thickness, metal surface step density, the effect of chemical and electronic properties of substrate, molecular flux (deposition rate), and energy during f...
Investigation Of The Device Properties Of Cztse Thin Films For Solar Cells Bayraklı, Özge; Güllü, Hasan Hüseyin; Parlak, Mehmet (2016-10-02) Thin Film Solar Cell has received a considerable attention in the photovoltaic industry. While the efficiency of thin film amorphous silicon is about %14, the efficiency of Cu(In,Ga)Se2 (CIGS) thin film based solar cells ,is very popular in the recent year, reached the value of %20. But CIGS based solar cells have some constraints such as its extensive and large scale production in terms of availability of its constituent elements. On the other hand, Kesterit based solar cells such as Cu2ZnSnSe4 (CZTSe) hav...
Investigation of optical parameters of thermally evaporated ZnSe thin films Gullu, H. H.; Coşkun, Emre; Parlak, Mehmet (2015-04-29) In this work, zinc selenide (ZnSe) thin films were deposited by thermal evaporation method using pure elemental (Zn and Se) sources. The physical properties of the films have been investigated in terms of the structural and optical characterizations depending on the post-annealing process under nitrogen atmosphere in the temperature between 300 and 500 degrees C for 30 min. The structural and compositional analyses were carried out by means of X-ray diffraction (XRD) and energy dispersive X-ray spectroscopy...
Effects of Substrate Temperature on material characteristics of sputtered Aluminum doped ZnO thin films Bayraklı, Özge; Emir, Cansu; Güllü, Hasan Hüseyin; Parlak, Mehmet (null; 2016-09-23) Transparent conductive layers (TCOs) attract the attention in opto-electronic and photovoltaic device applications due to their conductivity and transparency characteristics in the visible region of the solar spectrum. There are various TCO thin film layers, and indium tin oxide (ITO) and aluminum doped zinc oxide (AZO) are the most popular thin films such as the desired material characteristics of SnO2and ZnO, respectively. In literature, the works indicated that the characteristics of these films can be c...
Development of high performance active materials for microbolometers Eroğlu, Numan; Akın, Tayfun; Turan, Raşit; Department of Micro and Nanotechnology (2011) This thesis reports the development of Vanadium Tungsten Oxide (VWO) film as an active detector material for uncooled infrared detectors by using the reactive DC magnetron co-sputtering method. VWO is a doped form of the Vanadium Oxide (VOx) which is known as a prominent material for uncooled infrared detectors with its high TCR, low resistivity, and low noise properties. VOx is a widely preferred material for commercialized uncooled infrared detectors along with its drawbacks. Fabrication is fairly difficu...

Citation Formats

H. H. Güllü and M. Parlak, “Investigation of material properties of magnetron sputtered CuAg-In-Se thin films,” presented at the Science and Applications of Thin Films, Conference & Exhibition (SATF 2016) Izmir Institute of Technology, September 19-23, 2016, Izmir, Turkey, 2016, Accessed: 00, 2021. [Online]. Available: https://hdl.handle.net/11511/87619.