Investigation of material properties of magnetron sputtered CuAg-In-Se thin films

Date

2016-09-23

Author

Güllü, Hasan Hüseyin
Parlak, Mehmet

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Thin films of copper based chalcopyrite absorber materials are attracting the attention of many researchers because of their favorable optoelectronic properties and good stability makes them suitable for photovoltaic and optoelectronic device applications. These compounds are particularly suitable for making p-n hetero-junctions with the II-VI compounds. Therefore, the utilization of I-III-VI2 group of chalcopyrite semiconductors has been reported in the literature for application in thin film solar cells. In this work, the quaternary structure Cu-Ag-In-Se (CAIS) that belongs to the ternary semiconducting I-III-VI2 materials family formed by occupying the Cu sites alternatively with Ag has been investigated. CAIS thin films were prepared by using a magnetron DC/RF sputtering system, and CIS and Ag targets were used in the deposition process of the CAIS thin films in stacked layer formation to get a homogenous film structure. In fact, the work has been particularly concentrated on the wire-shaped formations on the CAIS film surfaces for the forms of as-deposited and thermally annealed at different temperatures. The characterizations of the thin films were done by X-ray diffraction (XRD), and also scanning electron microscope (SEM) equipped with energy dispersive X-ray analysis (EDXA) detector facility. The surface characteristics were investigated by SEM measurements and the observed nanostructures were detailed. Moreover, the complementary characterization of the films includes transmission and reflection measurements for optical; room temperature resistivity measurements and temperature dependent conductivity for electrical analysis.

Subject Keywords

Thin film, Annealing, Nanostructure

URI

https://hdl.handle.net/11511/87619
http://www.satf2016.org/docs/ABSTRACT_BOOK-satf_2016.pdf

Conference Name

Science and Applications of Thin Films, Conference & Exhibition (SATF 2016) Izmir Institute of Technology, September 19-23, 2016

Collections

Department of Physics, Conference / Seminar

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Citation Formats

H. H. Güllü and M. Parlak, “Investigation of material properties of magnetron sputtered CuAg-In-Se thin films,” presented at the Science and Applications of Thin Films, Conference & Exhibition (SATF 2016) Izmir Institute of Technology, September 19-23, 2016, Izmir, Turkey, 2016, Accessed: 00, 2021. [Online]. Available: https://hdl.handle.net/11511/87619.