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Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedback
Date
2005-01-01
Author
Dede, M.
Ürkmen, K.
Oral, Ahmet
Metadata
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In the scanning Hall probe microscopy (SHPM) technique, scanning tunneling microscope (STM) or atomic force microscope (AFM) feedback is usually used for bringing the Hall sensor into close proximity of a sample. Here, we used quartz crystal AFM feedback in microfabrication of Hall sensors and in the operation of SHPM. This method eliminates the necessity of conducting samples in SHPM.
URI
https://hdl.handle.net/11511/94378
DOI
https://doi.org/10.1109/intmag.2005.1463528
Conference Name
INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference
Collections
Department of Physics, Conference / Seminar
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Scanning Hall Probe Microscopy (SHPM) is a quantitative and non-invasive technique for imaging localized surface magnetic field fluctuations such as ferromagnetic domains with high spatial and magnetic field resolution of similar to 50 nm and 7 mG/Hz(1/2) at room temperature. In the SHPM technique, scanning tunneling microscope (STM) or atomic force microscope (AFM) feedback is used to keep the Hall sensor in close proximity of the sample surface. However, STM tracking SHPM requires conductive samples; ther...
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Scanning Hall probe microscopy (SHPM) is a quantitative and noninvasive technique to image magnetic samples with high spatial and magnetic field resolution: ∼120 nm & 6×10-6T/√(Hz) at room temperature. A sub-micron Hall probe is scanned over the sample surface to measure the surface magnetic fields using conventional scanning tunneling microscopy-positioning techniques. We have developed new low noise, high performance InSb Hall sensors for room temperature scanning Hall probe microscopy (RT-SHPM), which ha...
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A bismuth micro-Hall probe sensor with an integrated scanning tunnelling microscope tip was incorporated into a room temperature scanning Hall probe microscope system and successfully used for the direct magnetic imaging of microscopic domains of low coercivity perpendicular garnet thin films and demagnetized strontium ferrite permanent magnets. At a driving current of 800 muA, the Hall coefficient, magnetic field sensitivity and spatial resolution of the Bi probe were 3.3 x 10(-4) Omega /G, 0.38 G/root Hz ...
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M. Dede, K. Ürkmen, and A. Oral, “Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedback,” presented at the INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference, Nagoya, Japonya, 2005, Accessed: 00, 2021. [Online]. Available: https://hdl.handle.net/11511/94378.