Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedback

Date

2005-01-01

Author

Dede, M.
Ürkmen, K.
Oral, Ahmet

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In the scanning Hall probe microscopy (SHPM) technique, scanning tunneling microscope (STM) or atomic force microscope (AFM) feedback is usually used for bringing the Hall sensor into close proximity of a sample. Here, we used quartz crystal AFM feedback in microfabrication of Hall sensors and in the operation of SHPM. This method eliminates the necessity of conducting samples in SHPM.

URI

https://hdl.handle.net/11511/94378

DOI

https://doi.org/10.1109/intmag.2005.1463528

Conference Name

INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference

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Department of Physics, Conference / Seminar

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Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedback Dede, M.; Uerkmen, K.; Girisen, Oe.; Atabak, M.; Oral, Ahmet; Farrer, I.; Ritchie, D. (American Scientific Publishers, 2008-02-01) Scanning Hall Probe Microscopy (SHPM) is a quantitative and non-invasive technique for imaging localized surface magnetic field fluctuations such as ferromagnetic domains with high spatial and magnetic field resolution of similar to 50 nm and 7 mG/Hz(1/2) at room temperature. In the SHPM technique, scanning tunneling microscope (STM) or atomic force microscope (AFM) feedback is used to keep the Hall sensor in close proximity of the sample surface. However, STM tracking SHPM requires conductive samples; ther...
Scanning Hall probe microscopy of superconductors and magnetic materials Oral, Ahmet; Henini, M (1996-03-01) We describe results from a scanning Hall probe microscope operating in a broad temperature range, 4-300 K. A submicron Hall probe manufactured in a GaAs/AlGaAs two-dimensional electron gas is scanned over the sample to measure the surface magnetic fields using conventional scanning tunneling microscopy positioning techniques, The magnetic field structure of the sample together with the topography can be obtained simultaneously, The technique is noninvasive with an extremely low self-field of < 10(-2) G and ...
RT-SHPM imaging of permalloy microstructures and garnet films using new high performance InSb sensors Kaval, M.; Oral, Ahmet; Dede, M.; Sandhu, A. (2002-01-01) Scanning Hall probe microscopy (SHPM) is a quantitative and noninvasive technique to image magnetic samples with high spatial and magnetic field resolution: ∼120 nm & 6×10-6T/√(Hz) at room temperature. A sub-micron Hall probe is scanned over the sample surface to measure the surface magnetic fields using conventional scanning tunneling microscopy-positioning techniques. We have developed new low noise, high performance InSb Hall sensors for room temperature scanning Hall probe microscopy (RT-SHPM), which ha...
3D scanning Hall probe microscopy with 700 nm resolution DEDE, MUNIR; AKRAM, RİZWAN; Oral, Ahmet (2016-10-31) In this report, we present a three dimensional (3D) imaging of magnetic field vector (B) over right arrow (x,y,z) emanating from the magnetic material surfaces using a scanning Hall probe microscopy (3D-SHPM) down to a 700 nm spatial resolution. The Hall probe is used to measure B-z(x,y) on the specimen surface at different heights with the step size of Delta z = 250 nm, as we move away from the surface in z direction, until the field decays to zero. These set of images are then used to get partial derivati...
Direct magnetic imaging of ferromagnetic domain structures by room temperature scanning hall probe microscopy using a bismuth micro-hall probe SANDHU, ADARSH; MASUDA, HİROSHİ; Oral, Ahmet; BENDİNG, SİMON J (IOP Publishing, 2001-05-15) A bismuth micro-Hall probe sensor with an integrated scanning tunnelling microscope tip was incorporated into a room temperature scanning Hall probe microscope system and successfully used for the direct magnetic imaging of microscopic domains of low coercivity perpendicular garnet thin films and demagnetized strontium ferrite permanent magnets. At a driving current of 800 muA, the Hall coefficient, magnetic field sensitivity and spatial resolution of the Bi probe were 3.3 x 10(-4) Omega /G, 0.38 G/root Hz ...

Citation Formats

M. Dede, K. Ürkmen, and A. Oral, “Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedback,” presented at the INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference, Nagoya, Japonya, 2005, Accessed: 00, 2021. [Online]. Available: https://hdl.handle.net/11511/94378.