Electrical and structural characterization of bismuth thin films

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2005
Durkaya, Göksel
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Electrical and structural properties of Bismuth thin films were studied simultaneously. Electrical properties of the Bismuth thin films have been characterized by measuring temperature dependent conductivity and Hall effect. Structural analysis were carried out by X-ray diffraction technique and using a room temperature Atomic Force Microscope (RT-AFM).
Electricity and magnetism.
http://etd.lib.metu.edu.tr/upload/12606374/index.pdf
https://hdl.handle.net/11511/15176
Graduate School of Natural and Applied Sciences, Thesis

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Citation Formats
G. Durkaya, “Electrical and structural characterization of bismuth thin films,” M.S. - Master of Science, Middle East Technical University, 2005.
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