Electrical and structural characterization of bismuth thin films

Durkaya, Göksel
Electrical and structural properties of Bismuth thin films were studied simultaneously. Electrical properties of the Bismuth thin films have been characterized by measuring temperature dependent conductivity and Hall effect. Structural analysis were carried out by X-ray diffraction technique and using a room temperature Atomic Force Microscope (RT-AFM).


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Magnetic resonance imaging (MRI) is a high resolution medical imaging technique based on distinguishing tissues according to their nuclear magnetic properties. Magnetic resonance electrical impedance tomography (MREIT) is a conductivity imaging technique which reconstructs images of electrical properties, based on their effect on induced magnetic flux density due to externally applied current flow. Both of these techniques are of interest for novel research and development. Simulators help researchers obser...
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Electrical and magnetic properties of Si ion implanted YBa2Cu3O7-delta thin films and microbridges
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Fabrication of superconducting bilayer YBa2Cu3O7-delta (YBCO) thin film structure by Si ion implantation and properties of microbridge patterned on that are presented. YBCO thin film of 150 nm thickness was grown on single crystal (100) SrTiO3 substrate by inverted cylindrical magnetron sputtering. The sample was implanted with 100 keV, 1 X 10(16) Si ions/cm(2). Upon implantation with Si, the sample lost its electrical conductivity and diamagnetism while its crystalline structure was preserved after the ann...
Citation Formats
G. Durkaya, “Electrical and structural characterization of bismuth thin films,” M.S. - Master of Science, Middle East Technical University, 2005.