Development of software for calculations of the reflectance, transmittance and absorptance of multilayered thin films

Download

index.pdf

Date

2008

Author

Şimşek, Yusuf

Metadata

Show full item record

Item Usage Stats

287
views

116
downloads

The aim of this study is to develop a software which calculates reflection, transmission and absorption of multilayered thin films by using complex indices of refraction, as a function of both wavelength and thickness. For these calculations matrix methods will be considered and this software is programmed with the matrix method. Outputs of the program will be compared with the theoretical and experimental results studied in the scientific papers.

Subject Keywords

Physics.

URI

http://etd.lib.metu.edu.tr/upload/12610275/index.pdf
https://hdl.handle.net/11511/18330

Collections

Graduate School of Natural and Applied Sciences, Thesis

Suggestions

OpenMETU
Core

Deep-trench RIE optimization for high performance MEMS microsensors Aydemir, Akın; Turan, Raşit; Department of Physics (2007) This thesis presents the optimization of deep reactive ion etching process (DRIE) to achieve high precision 3-dimensional integrated micro electro mechanical systems (MEMS) sensors with high aspect ratio structures. Two optimization processes have been performed to achieve 20 μm depth for 1 μm opening for a dissolved wafer process (DWP) and to achieve 100 μm depth for 1 μm opening for silicon-on-glass (SOG) process. A number of parameters affecting the etch rate and profile angle are investigated, including...
Mems gyroscopes for tactical-grade inertial measurement applications Alper, Said Emre; Akın, Tayfun; Department of Electrical and Electronics Engineering (2005) This thesis reports the development of high-performance symmetric and decoupled micromachined gyroscopes for tactical-grade inertial measurement applications. The symmetric structure allows easy matching of the resonance frequencies of the drive and sense modes of the gyroscopes for achieving high angular rate sensitivity; while the decoupled drive and sense modes minimizes mechanical cross-coupling for low-noise and stable operation. Three different and new symmetric and decoupled gyroscope structures with...
Development of atomic force microscopy system and kelvin probe microscopy system for use in semiconductor nanocrystal characterization Bostancı, Umut; Turan, Raşit; Department of Physics (2007) Atomic Force Microscopy (AFM) and Kelvin Probe Microscopy (KPM) are two surface characterization methods suitable for semiconductor nanocrystal applications. In this thesis work, an AFM system with KPM capability was developed and implemented. It was observed that, the effect of electrostatic interaction of the probe cantilever with the sample can be significantly reduced by using higher order resonant modes for Kelvin force detection. Germanium nanocrystals were grown on silicon substrate using different g...
Physics and technology of the infrared detection systems based on heterojunctions Aslan, Bülent; Turan, Raşit; Department of Physics (2004) The physics and technology of the heterojunction infrared photodetectors having different material systems have been studied extensively. Devices used in this study have been characterized by using mainly optical methods, and electrical measurements have been used as an auxiliary method. The theory of internal photoemission in semiconductor heterojunctions has been investigated and the existing model has been extended by incorporating the effects of the difference in the effective masses in the active regio...
Design and production of antireflection coating for Ge, ZnSe and ZnS in 8-12 micrometer wavelength region Üçer, Begüm; Parlak, Mehmet; Department of Physics (2009) This thesis describes the works done during the design and deposition process of the antireflection coating for the materials commonly used as refractive optical elements in thermal imaging systems. These coatings are quite necessary to reduce reflection losses from the surface of the optics and stray light that directly affects the image quality. Germanium, zinc sulfide and zinc selenide were used as substrate material and their optical properties were investigated with infrared ellipsometry and FTIR. Anti...

Citation Formats

Y. Şimşek, “Development of software for calculations of the reflectance, transmittance and absorptance of multilayered thin films,” M.S. - Master of Science, Middle East Technical University, 2008.