The controlled drift detector as an x-ray imaging device for diffraction enhanced imaging

Özkan, Çiğdem
Diffraction Enhanced Imaging (DEI) is an X-ray imaging technique providing specific information about the molecular structure of a tissue by means of coherently scattered photons. A Controlled Drift Detector (CDD) is a novel 2D silicon imager developed to be used in X-ray imaging techniques. In this work a final (complete and detailed) analysis of DEI data taken with the CDD in the ELETTRA synchrotron light source facility in Trieste (Italy) in 2005, is presented and the applicability of both this new technique and the novel detector are discussed.


Photoluminescence properties of Si nanocrystals embedded in SiO2 matrix
Seyhan, Ayşe; Turan, Raşit; Department of Physics (2010)
This thesis examines the luminescence properties of nanoscale silicon (Si) by using spectroscopic techniques. Since the development of new optical devices requires understanding light emission mechanism optical spectroscopy has become more important tool in the analysis of these structures. In this thesis, Si nanocrystals embedded in SiO2 matrix will be studied. Photoluminescence (PL) and Time-resolved photoluminescence spectroscopy (TRPL) have been used to detect the light emission in UV-Vis-NIR range. Exp...
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Köseoğlu, Devrim; Bilikmen, Kadri Sinan; Department of Physics (2010)
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Güler, Urcan; Turan, Raşit; Department of Physics (2009)
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Bektaş, Murat; Altan, Hakan; Department of Physics (2009)
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The Use of Terahertz Spectroscopy as a Sensitive Probe in Discriminating the Electronic Properties of Structurally Similar Multi-Walled Carbon Nanotubes
Parrott, Edward P. J.; Zeitler, J. Axel; McGregor, James; Oei, Shu-Pei; Ünalan, Hüsnü Emrah; Milne, William I.; Tessonnier, Jean-Philippe; Su, Dong Sheng; Schloegl, Robert; Gladden, Lynn F. (2009-10-19)
Terahertz: spectroscopy is used to definitively distinguish between two multi-walled carbon nanotubes (see figure), which have commercial applications in a number of advanced materials. Other techniques do not provide a sensitive discrimination of the measured properties. This observation is rationalized by considering the dielectric nature of the materials and the relationship of this to their structural differences.
Citation Formats
Ç. Özkan, “The controlled drift detector as an x-ray imaging device for diffraction enhanced imaging,” M.S. - Master of Science, Middle East Technical University, 2009.