Preparation and microstructural characterization of oriented titanosilicate ETS-10 thin films on indium tin oxide surfaces

Date

2010-06-01

Author

Galioglu, Sezin
Ismail, Mariam N.
Warzywoda, Juliusz
Sacco, Albert
Akata Kurç, Burcu

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Oriented polycrystalline ETS-10 thin films (average thickness similar to 1.50-1.75 mu m) were prepared on the ITO glass substrates using secondary growth of ETS-10 multilayers with a partial a(b)-out-of-plane preferred crystal orientation. After secondary growth, the films showed a columnar grain microstructure, and a significantly increased degree of a(b)-out-of-plane orientation. This orientation is desirable for advanced applications of ETS-10 films. The prepared films were strongly attached to the ITO glass substrates as evidenced by the absence of discernible differences in the substrate coverage with film after a 60-min ultrasonication in water.

Subject Keywords

ETS-10, Titanosilicates, Indium tin oxide, Secondary growth, Thin films

URI

https://hdl.handle.net/11511/31911

Journal

MICROPOROUS AND MESOPOROUS MATERIALS

DOI

https://doi.org/10.1016/j.micromeso.2010.02.001

Collections

Graduate School of Natural and Applied Sciences, Article

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Citation Formats

S. Galioglu, M. N. Ismail, J. Warzywoda, A. Sacco, and B. Akata Kurç, “Preparation and microstructural characterization of oriented titanosilicate ETS-10 thin films on indium tin oxide surfaces,” MICROPOROUS AND MESOPOROUS MATERIALS, pp. 401–406, 2010, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/31911.