Show/Hide Menu
Hide/Show Apps
Logout
Türkçe
Türkçe
Search
Search
Login
Login
OpenMETU
OpenMETU
About
About
Open Science Policy
Open Science Policy
Open Access Guideline
Open Access Guideline
Postgraduate Thesis Guideline
Postgraduate Thesis Guideline
Communities & Collections
Communities & Collections
Help
Help
Frequently Asked Questions
Frequently Asked Questions
Guides
Guides
Thesis submission
Thesis submission
MS without thesis term project submission
MS without thesis term project submission
Publication submission with DOI
Publication submission with DOI
Publication submission
Publication submission
Supporting Information
Supporting Information
General Information
General Information
Copyright, Embargo and License
Copyright, Embargo and License
Contact us
Contact us
Optical and structural characteristics of electrodeposited Cd 1-xZnxS nanostructured thin films
Date
2021-04-01
Author
Erturk, K.
Isik, M.
Terlemezoglu, M.
Hasanlı, Nızamı
Metadata
Show full item record
This work is licensed under a
Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License
.
Item Usage Stats
214
views
0
downloads
Cite This
The structural and optical characteristics of Cd1-xZnxS (CdZnS) thin films grown by the electrodeposition method were investigated in the present paper. The crystalline structure of the grown CdZnS thin film was determined as cubic wurtzite due to observed diffraction peaks associated with (111) and (220) planes. Atomic compositional ratios of the constituent elements were obtained using energy dispersive spectroscopy and doping concentration of the Zn was found as 5% (x ~ 0.05). Scanning electron microscopy image of the studied thin film indicated that grown film is nanostructured. Raman spectra of CdS and CdZnS thin films were measured and it was seen that observed longitudinal optical modes for CdZnS present a blue-shift. Temperature-dependent band gap energy characteristics of the thin films were studied performing transmission experiments in the 10–300 K temperature range. The analyses of the recorded transmittance spectra showed that direct band gap energy of the films decreases from 2.56 eV (10 K) to 2.51 eV (300 K) with the increase of temperature. The band gap energy vs. temperature dependency was studied applying well-known Varshni optical model and various optical parameters of the films were reported according to the results of the applied model.
Subject Keywords
CdS
,
Thin film
,
Optical properties
,
Cd1-xZnxS
URI
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85101868097&origin=inward
https://hdl.handle.net/11511/90847
Journal
Optical Materials
DOI
https://doi.org/10.1016/j.optmat.2021.110966
Collections
Department of Physics, Article
Suggestions
OpenMETU
Core
Optical and electrical characteristics of thermally evaporated Cu0.5Ag0.5InSe2 thin films
Gullu, H. H.; Bayrakli, O.; Parlak, Mehmet (2017-10-01)
In this study, optical and electrical characteristics of the Cu0.5Ag0.5InSe2 (CAIS) polycrystalline thin films were investigated. They were deposited on soda lime glass substrates with the evaporation of pure elemental sources by using physical thermal evaporation technique at 200 degrees C substrate temperature. The thin films were characterized firstly in as-grown form, and then annealed under the nitrogen environment to deduce the effects of annealing on the optical and electrical properties of the depos...
Structural and optical properties of thermally evaporated Ga-In-Se thin films
IŞIK, MEHMET; Güllü, Hasan Hüseyin (2014-05-30)
In this paper, structural and optical properties of Ga-In-Se (GIS) thin films deposited by thermal evaporation technique have been investigated. The effect of annealing was also studied for samples annealed at temperatures between 300 degrees C and 500 degrees C. X-ray diffraction, energy dispersive X-ray analysis and scanning electron microscopy have been used for structural characterization. It was reported that increase of annealing temperature results with better crystallization and chemical composition...
Structural and optical characteristics of thermally evaporated TlGaSe2 thin films
Isik, M.; KARATAY, AHMET; Hasanlı, Nızamı (2022-02-01)
The present paper reports the structural and optical properties of thermally evaporated TlGaSe2 thin films. X-ray diffraction pattern of evaporated film presented two diffraction peaks around 24.15 and 36.00° which are associated with planes of monoclinic unit cell. Surface morphology of the TlGaSe2 thin films was investigated by scanning electron and atomic force microscopy techniques. Although there was observed some ignorable amount of clusters of quasi-spherical shape in the scanning electron microscope...
Investigation of structural and optical characteristics of thermally evaporated Ga2Se3 thin films
Isik, M.; Hasanlı, Nızamı (2020-09-01)
Ga2Se3 thin films were prepared by thermal evaporation technique and structural, optical characteristics of the deposited thin films were investigated in the present study. X-ray diffraction pattern of the thin film exhibited one intensive and sharp peak associated with (111) plane of cubic crystalline structure of the compound. Energy dispersive spectroscopic analyses pointed out the atomic compositional ratio of the constituent elements as consistent with chemical formula of Ga2Se3. The optical characteri...
Structural and optical properties of Zn-In-Te thin films deposited by thermal evaporation technique
Gullu, H. H.; Bayrakli, O.; CANDAN, İDRİS; COŞKUN, EMRE; Parlak, Mehmet (2013-07-25)
Annealing effects on structural and optical properties of the thermally evaporated Zn-In-Te(ZIT) thin films have been investigated. The structural and the compositional analyses were carried out by means of X-ray diffraction (XRD) and energy dispersive X-ray analysis (EDXA). The as-grown and annealed ZIT films had polycrystalline structure and the preferred orientation changed from (220) to (112) direction with increasing annealing temperature. The optical properties and constants were determined by transmi...
Citation Formats
IEEE
ACM
APA
CHICAGO
MLA
BibTeX
K. Erturk, M. Isik, M. Terlemezoglu, and N. Hasanlı, “Optical and structural characteristics of electrodeposited Cd 1-xZnxS nanostructured thin films,”
Optical Materials
, pp. 0–0, 2021, Accessed: 00, 2021. [Online]. Available: https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85101868097&origin=inward.