Microscopic measurement of penetration depth in YBa2Cu3O7-delta thin films by scanning Hall probe microscopy

Date

1997-01-01

Author

Oral, Ahmet
HUMPHREYS, RG
HENİNİ, M

Metadata

Show full item record

This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Item Usage Stats

127
views

0
downloads

We have used a low noise scanning Hall probe microscope to measure the penetration depth microscopically in a YBa2Cu3O7-delta thin film as a function of temperature. The instrument has high magnetic field (approximate to 2.9 x 10(-8) T HZ(-1/2) at 77 K) and spatial resolution ( approximate to 0.85 mu m). Magnetic field profiles of single vortices in the superconducting film have been successfully measured and the microscopic penetration depth of the superconductor has been extracted. We find surprisingly large variations in values of lambda for different vortices within the scanning field.

Subject Keywords

Temperature-dependence, Force microscopy, Vortex, Superconductors

URI

https://hdl.handle.net/11511/32840

Journal

SUPERCONDUCTOR SCIENCE & TECHNOLOGY

DOI

https://doi.org/10.1088/0953-2048/10/1/003

Collections

Department of Physics, Article

Suggestions

OpenMETU
Core

Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy Oral, Ahmet; ÖZER, HAKAN ÖZGÜR; HOFFMANN, PM; PETHICA, JB (2001-09-17) Quantitative force gradient images are obtained using a sub-angstrom amplitude, off-resonance lever oscillation method during scanning tunneling microscopy imaging. We report the direct observation of short-range bonds, and the measured short-range force interaction agrees well in magnitude and length scale with theoretical predictions for single bonds. Atomic resolution is shown to be associated with the presence of a prominent short-range contribution to the total force interaction. It is shown that the b...
Real-time scanning hall probe microscopy Oral, Ahmet; HENİNİ, M (1996-08-26) We describe a low-noise scanning Hall probe microscope having unprecedented magnetic field sensitivity (similar to 2.9x10(-8) T/root Hz at 77 K), high spatial resolution, (similar to 0.85 mu m),nd operating in real-time (similar to 1 frame/s) for studying flux profiles at surfaces. A submicron Hall probe manufactured in a GaAs/A1GaAs two-dimensional electron gas (2DEG) is scanned over the sample to measure the surface magnetic fields using conventional scanning tunneling microscopy positioning techniques. F...
Vortex imaging in superconducting films by Scanning Hall Probe Microscopy Oral, Ahmet; HUMPHREYS, R G; HENİNİ, M (Springer Science and Business Media LLC, 1996-12-01) We have used a low noise Scanning Hall Probe Microscope (SHPM) to study vortex structures in superconducting films. The microscope has high magnetic field (similar to 2.9 x 10(-8)T/root Hz at 77 K) and spatial resolution, similar to 0.85 mu m. Magnetic field profiles of single vortices in High T-c YBa2Cu3O7-delta thin films have been successfully measured and the microscopic penetration depth of the superconductor has been extracted as a function of temperature. Flux penetration into the superconductor has ...
Thermo-optic tuning of erbium-doped amorphous silicon nitride microdisk resonators Hryciw, Aaron C.; Kekatpure, Rohan D.; Yerci, Selçuk; Dal Negro, Luca; Brongersma, Mark L. (2011-01-24) We demonstrate a technique to yield a direct and sensitive measurement of the thermo-optic coefficient (TOC) for light-emitting materials in optical microdisk resonators. Using photoluminescence from erbium-doped amorphous silicon nitride (a-SiN(x):Er) as an example, we show how the TOC can be extracted from thermally induced shifts in the resonant microdisk modes. For the highest-performance a-SiN(x):Er material composition, we find a TOC at 1.54 mu m of similar to 3 X 10(-5) K(-1) in the 300-500 K range. ...
Non-contact atomic force microscope in ultra high vacuum using radiation pressure excitation of cantilever with Fabry-Perot interferometer Karagöz, Ercan; Oral, Ahmet; Department of Physics (2017) In this study Non-Contact Atomic Force Microscope (NC-AFM) imaging was performed by excitation of the cantilever via radiation pressure in a custom Ultra-High Vacuum (UHV) system. Both the excitation of the cantilever and the measurement of the deflection of the cantilever were done by employing a fiber Fabry-Pérot interferometer obtained by a TiO2 coating of the fiber end. This coating allows for a several times higher interference slope. The second normal mode of the cantilever oscillation, along with the...

Citation Formats

A. Oral, R. HUMPHREYS, and M. HENİNİ, “Microscopic measurement of penetration depth in YBa2Cu3O7-delta thin films by scanning Hall probe microscopy,” SUPERCONDUCTOR SCIENCE & TECHNOLOGY, pp. 17–20, 1997, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/32840.