Real-time scanning hall probe microscopy

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Date

1996-08-26

Author

Oral, Ahmet
BENDİNG, S J
HENİNİ, M

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We describe a low-noise scanning Hall probe microscope having unprecedented magnetic field sensitivity (similar to 2.9x10(-8) T/root Hz at 77 K), high spatial resolution, (similar to 0.85 mu m),nd operating in real-time (similar to 1 frame/s) for studying flux profiles at surfaces. A submicron Hall probe manufactured in a GaAs/A1GaAs two-dimensional electron gas (2DEG) is scanned over the sample to measure the surface magnetic fields using conventional scanning tunneling microscopy positioning techniques. Flux penetration into a high T-c YBa2Cu3O7-delta thin film has been observed in real time at 85 K with single vortex resolution. Flux is seen to enter the film in the form of vortex bundles as well as single flux quanta, Phi(0). (C) 1996 American Institute of Physics.

Subject Keywords

FORCE MICROSCOPY

URI

https://hdl.handle.net/11511/38181

Journal

APPLIED PHYSICS LETTERS

DOI

https://doi.org/10.1063/1.117582

Collections

Department of Physics, Article

Citation Formats

A. Oral, S. J. BENDİNG, and M. HENİNİ, “Real-time scanning hall probe microscopy,” APPLIED PHYSICS LETTERS, vol. 69, no. 9, pp. 1324–1326, 1996, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/38181.