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Current transport mechanisms in low resistive CdS thin films
Date
1997-02-01
Author
Günal, İbrahim
Parlak, Mehmet
Metadata
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Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License
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The current transport mechanisms in polycrystalline CdS thin films have been studied as a function of temperature over the temperature range 20-230 K. Conductivity data for the high temperature region has been analysed using Seto's model of thermionic emission. At intermediate temperatures it was found that thermionic emission and tunnelling of carriers through the potential barrier both contribute to the conductivity. Below 100 K Mott's hopping process appears to be the predominant conduction mechanism.
Subject Keywords
Electrical and Electronic Engineering
,
Atomic and Molecular Physics, and Optics
,
Electronic, Optical and Magnetic Materials
,
Condensed Matter Physics
URI
https://hdl.handle.net/11511/37442
Journal
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
DOI
https://doi.org/10.1023/a:1018540601482
Collections
Department of Physics, Article
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İ. Günal and M. Parlak, “Current transport mechanisms in low resistive CdS thin films,”
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
, pp. 9–13, 1997, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/37442.