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Electron beam evaporation of nickel manganite thin-film negative temperature coefficient thermistors
Date
1998-12-01
Author
Parlak, Mehmet
Hashemi, Toraj
Hogan, MJ
Brinkman, AW
Metadata
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This work is licensed under a
Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License
.
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Subject Keywords
Oxide thermistors
,
Spectroscopy
,
Conductivity
URI
https://hdl.handle.net/11511/41177
Journal
JOURNAL OF MATERIALS SCIENCE LETTERS
DOI
https://doi.org/10.1023/a:1006612706903
Collections
Department of Physics, Article
Citation Formats
IEEE
ACM
APA
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MLA
BibTeX
M. Parlak, T. Hashemi, M. Hogan, and A. Brinkman, “Electron beam evaporation of nickel manganite thin-film negative temperature coefficient thermistors,”
JOURNAL OF MATERIALS SCIENCE LETTERS
, vol. 17, no. 23, pp. 1995–1997, 1998, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/41177.
