Analytical precision limits in slitless spectroscopy

Date

2012-08-05

Author

Öktem, Sevinç Figen

Metadata

Show full item record

This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Item Usage Stats

157
views

0
downloads

We consider the problem of estimating emission line parameters from the measurements of a multi-order slitless spectrometer. This problem can be viewed as a multi-frame deblurring problem with shift variant Gaussian blur. By using Cramer-Rao lower bound theory, we derive analytical precision limits to this parameter estimation when the measurements are corrupted with Gaussian noise. The derivation involves an approximation to the Fisher information matrix in order to obtain closed-form expressions. An important feature of our treatment is to provide a framework for exploring the optimized instrument requirements, including various potential observing scenarios, spatial and spectral resolutions, and signal-to-noise ratio.

Subject Keywords

Emission line-profile

URI

https://hdl.handle.net/11511/42010

DOI

https://doi.org/10.1109/ssp.2012.6319734

Collections

Department of Electrical and Electronics Engineering, Conference / Seminar

Suggestions

OpenMETU
Core

Computer simulation of grain boundary grooving and cathode voiding n bamboo interconnects by surface diffusion under capillary and electromigration forces Akyıldız, Öncü; Oğurtanı, Tarık Ö.; Department of Metallurgical and Materials Engineering (2004) The processes of grain boundary grooving and cathode voiding which are important in determining the life times of thin films connecting the transistors in an integrated circuit are investigated by introducing a new mathematical model, which flows from the fundamental postulates of irreversible thermodynamics, accounting for the effects of applied electric field and thermal stresses. The extensive computer studies on the triple junction displacement dynamics shows that it obeys the first order reaction kinet...
Analysis of flexible pavements incorporating nonlinear resilient behavior of unbound granular layers Karagöz, Cem; Acar, Soner Osman; Department of Civil Engineering (2004) Traditionally, the resilient modulus values obtained from repeated unconfined or triaxial compression tests are used as the elastic modulus of granular layers in structural analysis of flexible pavements. Sometimes the resilient modulus of granular materials are estimated from known California bearing ratios (CBR) or stabilometer resistance (R) values by simple regression equations. On the other hand, it is well known that stress-strain relation for unbound granular materials is nonlinear and the resilient ...
Investigation of ruthenium-copper bimetallic catalysts for direct epoxidation of propylene: A DFT study Kizilkaya, Ali Can; Senkan, Selim; Önal, Işık (2010-09-01) Propylene epoxidation reactions are carried out on Ru-Cu(1 1 1) and Cu(1 1 1) surfaces with periodic density functional theory (DFT) calculations. Ru-Cu(1 1 1) surface is modeled as Cu(1 1 1) monolayer totally covering the Ru(0 0 0 1) surface underneath, in accordance with the literature. It is shown that the Ru-Cu(1 1 1) surface is ineffective for propylene oxide formation since it has a lower energy barrier (0.48 eV) for the stripping of the allylic hydrogen of propylene and a higher energy barrier (0.92 ...
MUTUAL COUPLING EFFECTS OF FINITE RECTANGULAR PHASED-ARRAYS YAVUZ, H; BUYUKDURA, OM (1994-04-14) A rigorous integral equation formulation for the analysis of a phased array of flangemounted waveguide apertures is given for a finite number of elements and nonuniform spacings. The resulting set of ihtegrd equations is reduced to a matrix equation called the coupling matrix which relates the coefficients of all the modes in all the waveguides to one another. The solution then yields the dominant mode reflection coefficient, coefficients of scattered modes and hence the field in each waveguide. The blockTo...
Investigation of on-wafer TRL calibration accuracy dependence on transitions and probe positioning Atasoy, H.I.; Unlu, M.; Topalli, K.; Istanbulluoglu, I.; Temocin, E.U.; Bayraktar, O.; Demir, Şimşek; Civi, O.; Koç, Seyit Sencer; Akın, Tayfun (2006-09-12) This paper presents the effects of various transition types from the measurement plane to the reference plane in TRL calibration and probe positioning effects for on wafer measurements of CPW based devices. Fourteen different transition types, with direct, linear and exponential transitions, including 3 different variations of ground-signal-ground (GSG) spacing are examined. To observe the performance of the transitions, simple CPW transmission lines of different characteristic impedances are fabricated usi...

Citation Formats

S. F. Öktem, “Analytical precision limits in slitless spectroscopy,” 2012, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/42010.