Effects of annealing on structural and morphological properties of e-beam evaporated AgGaSe2 thin films

Date

2009-03-15

Author

KARAAĞAÇ, HAKAN
Parlak, Mehmet

Metadata

Show full item record

This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Item Usage Stats

30
views

0
downloads

Polycrystalline AgGaSe2 thin films were deposited by using single crystalline powder of AgGaSe2 grown by vertical Bridgman-Stockbarger technique. Post-annealing effect on the structural and morphological properties of the deposited films were studied by means of X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM) with energy dispersive X-ray analysis (EDXA) measurements. XRD analysis showed that as-grown films were in amorphous structure, whereas annealing between 300 and 600 degrees C resulted in polycrystalline structure. At low annealing temperature, they were composed of Ag, Ga2Se3, GaSe, and AgGaSe2 phases but with increasing annealing temperature AgGaSe2 was becoming the dominant phase. In the as-grown form, the film surface had large agglomerations of Ag as determined by EDXA analysis and they disappeared because of the triggered segregation of constituent elements with increasing annealing temperature. Detail analyses of chemical composition and bonding nature of the films were carried out by XPS survey. The phases of AgO, Ag, Ag2Se, AgGaSe2, Ga, Ga2O3, Ga2Se3, Se and SeO2 were identified at the surface (or near the surface) of AgGaSe2 thin films depending on the annealing temperature, and considerable changes in the phases were observed.

Subject Keywords

Surfaces, Coatings and Films

URI

https://hdl.handle.net/11511/47924

Journal

APPLIED SURFACE SCIENCE

DOI

https://doi.org/10.1016/j.apsusc.2009.01.054

Collections

Department of Physics, Article

Suggestions

OpenMETU
Core

Deposition and characterization of layer-by-layer sputtered AgGaSe2 thin films KARAAĞAÇ, HAKAN; Parlak, Mehmet (Elsevier BV, 2011-04-15) Sputtering technique has been used for the deposition of AgGaSe2 thin films onto soda-lime glass substrates using sequential layer-by-layer deposition of GaSe and Ag thin films. The analysis of energy dispersive analysis of X-ray (EDXA) indicated a Ga-rich composition for as-grown samples and there was a pronounce effect of post-annealing on chemical composition of AgGaSe2 thin film. X-ray diffraction (XRD) measurements revealed that Ag metallic phase exists in the amorphous AgGaSe2 structure up to annealin...
Structural characterization of polycrystalline Ag-In-Se thin films deposited by e-beam technique Colakoglu, T.; Parlak, Mehmet (Elsevier BV, 2008-01-15) The Ag-In-Se thin films were deposited by e-beam evaporation of the Ag3In5Se9 single crystal powder under high vacuum without intentional doping. Energy dispersive X-ray analysis (EDXA) showed the decreasing behavior of Se and Ag in the structure depending on the annealing. X-ray diffraction (XRD) analysis showed that as-grown films have amorphous structure while annealing the films under nitrogen environment at 200 degrees C transformed from the amorphous to polycrystalline structure. The crystallinity of ...
Effects of microcompounding process parameters on the properties of ABS/polyamide-6 blends based nanocomposites Oezkoc, Gueralp; Bayram, Göknur; Quaedflieg, Martin (Wiley, 2008-03-05) Melt intercalation method was applied to produce acrylonitrile-butadiene-styrene/polyamide-6 (ABS/ PA6) blends based organoclay nanocomposites using a conical twin-screw microcompounder. The blend was compatibilized using a maleated olefinic copolymer. The effects of microcompounding conditions such as screw speed, screw rotation-mode (co- or counter-), and material parameters such as blend composition and clay loading level on the morphology of the blends, dispersibility of nanoparticles, and mechanical pr...
Characterization of AgGa0.5In0.5Se2 thin films deposited by electron-beam technique KARAAĞAÇ, HAKAN; KALELİ, Murat; Parlak, Mehmet (IOP Publishing, 2009-08-21) AgGa0.5In0.5Se2 thin films were deposited onto a quartz substrate by the electron-beam technique. For the investigation of the annealing effect on structural, optical and electrical properties of deposited films, samples were annealed in the temperature range 300-775 degrees C. The composition analyses of the deposited films carried out by energy dispersive x-ray analysis measurements have shown that the deposited AgGa0.5In0.5Se2 films were indium- and gallium-rich but selenium-and slightly silver-deficient...
Effect of composite preparation techniques on electrical and mechanical properties and morphology of nylon 6 based conductive polymer composites Koysuren, Ozcan; Yesil, Sertan; Bayram, Göknur (Wiley, 2006-11-05) Nylon 6/carbon black conductive composites were prepared using two different methods, masterbatch dilution and melt mixing. Their effect on the size and distribution of carbon black agglomerates in the matrix was studied in terms of electrical and mechanical properties and morphology. The electrical resistivity of composites prepared by both methods decreased with increasing filler composition. The electrical resistivity of the diluted masterbatch composites and the melt mixed composites was reduced from th...

Citation Formats

H. KARAAĞAÇ and M. Parlak, “Effects of annealing on structural and morphological properties of e-beam evaporated AgGaSe2 thin films,” APPLIED SURFACE SCIENCE, pp. 5999–6006, 2009, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/47924.