Characteristic x-ray, photoelectron and compton-scattered photon escape from a HPGe detector

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2003

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Yılmaz, Ercan

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Escape of photoelectrons, Compton-scattered photons and Ge X-rays from a HPGe detector was studied as a function of energy in the range 8-52 keV. A variableenergy source producing Cu, Rb, Mo, Ag, Ba, and Tb X-rays was used. All three mechanisms for energy loss were observed in the same experiment for Ba and Tb, while only X-ray and photoelectron escapes were evident in the spectra for Ag, Mo, Rb, and Cu. Spectral features and possible mechanisms for partial energy deposition were investigated. A Monte Carlo program was used to simulate the relevant interactions and to estimate the escape probabilities.

Subject Keywords

Physics, Power resources, X-ray lasers, Photoelectron spectroscopy

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http://etd.lib.metu.edu.tr/upload/3/1210061/index.pdf
https://hdl.handle.net/11511/13942

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Graduate School of Natural and Applied Sciences, Thesis

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Photoelectron, compton and characteristic x-ray escape from an HPGe detector in the range 8-52 keV Yilmaz, E; Can, Cüneyt (Wiley, 2004-11-01) Escape of photoelectrons, Compton-scattered photons and Ge x-rays from an HPGe detector was studied as a function of energy in the range 8-52 keV. A variable-energy source producing Cu, Rb, Mo, Ag, Ba. and Tb x-rays was used. All three mechanisms for energy loss were observed in the same experiment for Ba and Tb, while only x-ray and photoelectron escapes were evident in the spectra for Ag, Mo, Rb, and Cu. Spectral features and possible mechanisms for partial energy deposition were investigated. A Monte Car...
Escape of photoelectrons and Compton-scattered photons from an HPGe detector Can, Cüneyt (Wiley, 2003-07-01) The response function of a planar HPGe detector due to escape of photoelectrons and Compton-scattered photons was studied for a point source with 59.5 keV energy. It was shown that both mechanisms, in addition to Ge x-ray escape, leading to partial deposition of energy, could be observed in the same experiment. A Monte Carlo program was used to investigate these components of the response function. The results indicate that although the escape of scattered photons and Ge x-rays are of the same magnitude, th...
Components of detector response function: Monte Carlo simulations and experiment Pekoz, Rengin; Can, Cüneyt (Wiley, 2006-11-01) Components of the response function of an HPGe detector for 32 keV incident photons (Ba K alpha x-rays) were studied using a Monte Carlo program. Physical mechanisms and the role of incident photons, detector x-rays, photoelectrons and Compton recoil and Auger electrons for each component were investigated. The position, intensity and shape of the components, particularly of the photoelectrons, were studied in detail. Two distinct components for photoelectron escape were identified by considering the fate o...
An investigation of x-ray escape for an HPGe detector Can, Cüneyt; Bilgici, SZ (Wiley, 2003-07-01) X-ray escape peaks for a planar HPGe detector were investigated for a point source of photons with 59.5 keV energy. The effect of the solid angle for the incident photons on the escape probability of Ge K x-rays was studied using collimators with varying apertures. A Monte Carlo program was also developed to estimate the probability of escape for various mechanisms and routes. The experimental and simulation results showed that the escape probability is essentially constant for a wide range of collimator ra...
Escape of photons and electrons from an HPGe detector at 81 keV Yilmaz, E; Pekoz, R; Can, Cüneyt (Wiley, 2006-01-01) Escape of Ge K x-rays, Compton-scattered incident radiation and photoelectrons from an HPGe detector was investigated for 81 keV incident photons. All three escape mechanisms were observed in the same experiment. Experimental escape fractions were compared with the results from Monte Carlo simulations. Good agreement was obtained for the escape of photons. However, the simulations underestimated the escape of photoelectrons. Copyright (c) 2005 John Wiley & Sons, Ltd.

Citation Formats

E. Yılmaz, “Characteristic x-ray, photoelectron and compton-scattered photon escape from a HPGe detector,” Ph.D. - Doctoral Program, Middle East Technical University, 2003.