Optical characterization of CuIn5S8 crystals by ellipsometry measurements

Date

2016-04-01

Author

IŞIK, MEHMET
Gasanly, Nizami

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Optical properties of CuIn5S8 crystals grown by Bridgman method were investigated by ellipsometry measurements. Spectral dependence of optical parameters; real and imaginary parts of the pseudodielectric function, pseudorefractive index, pseudoextinction coefficient, reflectivity and absorption coefficients were obtained from the analysis of ellipsometry experiments performed in the 1.2-6.2 eV spectral region. Analysis of spectral dependence of the absorption coefficient revealed the existence of direct band gap transitions with energy 1.53 eV. Wemple-DiDomenico and Spitzer-Fan models were used to find the oscillator energy, dispersion energy, zero-frequency refractive index and high-frequency dielectric constant values. Structural properties of the CuIn5S8 crystals were investigated using X-ray diffraction and energy dispersive spectroscopy analysis.

Subject Keywords

Optical properties, Optical materials, Semiconductors

URI

https://hdl.handle.net/11511/65627

Journal

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS

DOI

https://doi.org/10.1016/j.jpcs.2015.11.020

Collections

Department of Physics, Article

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Citation Formats

M. IŞIK and N. Gasanly, “Optical characterization of CuIn5S8 crystals by ellipsometry measurements,” JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, pp. 13–17, 2016, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/65627.