Ellipsometry study of optical parameters of AgIn5S8 crystals

Date

2015-12-01

Author

IŞIK, MEHMET
Gasanly, NIZAMI

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Agln(5)S(8) crystals grown by Bridgman method were characterized for optical properties by ellipsometry measurements. Spectral dependence of optical parameters; real and imaginary parts of the pseudodielectric function, pseudorefractive index, pseudoextinction coefficient, reflectivity and absorption coefficient were obtained from ellipsometiy experiments carried out in the 1.2-6.2 eV range. Direct band gap energy of 1.84 eV was found from the analysis of absorption coefficient vs. photon energy. The oscillator energy, dispersion energy and zero-frequency refractive index, high-frequency dielectric constant values were found from the analysis of the experimental data using Wemple-DiDomenico and Spitzer-Fan models. Crystal structure and atomic composition ratio of the constituent elements in the AgIn5S8 crystal were revealed from structural characterization techniques of X-ray diffraction and energy dispersive spectroscopy. (C) 2015 Elsevier B.V. All rights reserved

Subject Keywords

Semiconductors, Optical properties, Ellipsometry

URI

https://hdl.handle.net/11511/35807

Journal

PHYSICA B-CONDENSED MATTER

DOI

https://doi.org/10.1016/j.physb.2015.09.016

Collections

Department of Physics, Article

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Citation Formats

M. IŞIK and N. Gasanly, “Ellipsometry study of optical parameters of AgIn5S8 crystals,” PHYSICA B-CONDENSED MATTER, pp. 127–130, 2015, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/35807.