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Ellipsometry study of optical parameters of AgIn5S8 crystals
Date
2015-12-01
Author
IŞIK, MEHMET
Gasanly, NIZAMI
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Agln(5)S(8) crystals grown by Bridgman method were characterized for optical properties by ellipsometry measurements. Spectral dependence of optical parameters; real and imaginary parts of the pseudodielectric function, pseudorefractive index, pseudoextinction coefficient, reflectivity and absorption coefficient were obtained from ellipsometiy experiments carried out in the 1.2-6.2 eV range. Direct band gap energy of 1.84 eV was found from the analysis of absorption coefficient vs. photon energy. The oscillator energy, dispersion energy and zero-frequency refractive index, high-frequency dielectric constant values were found from the analysis of the experimental data using Wemple-DiDomenico and Spitzer-Fan models. Crystal structure and atomic composition ratio of the constituent elements in the AgIn5S8 crystal were revealed from structural characterization techniques of X-ray diffraction and energy dispersive spectroscopy. (C) 2015 Elsevier B.V. All rights reserved
Subject Keywords
Semiconductors
,
Optical properties
,
Ellipsometry
URI
https://hdl.handle.net/11511/35807
Journal
PHYSICA B-CONDENSED MATTER
DOI
https://doi.org/10.1016/j.physb.2015.09.016
Collections
Department of Physics, Article
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M. IŞIK and N. Gasanly, “Ellipsometry study of optical parameters of AgIn5S8 crystals,”
PHYSICA B-CONDENSED MATTER
, pp. 127–130, 2015, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/35807.