Nanoscale charging hysteresis measurement by multifrequency electrostatic force spectroscopy

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Date

2008-03-03

Author

Bostanci, Umut
Abak, M. Kurtulus
AKTAŞ, Özgür
DANA, Aykutlu

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We report a scanning probe technique that can be used to measure charging of localized states on conducting or partially insulating substrates at room temperature under ambient conditions. Electrostatic interactions in the presence of a charged particle between the tip and the sample is monitored by the second order flexural mode, while the fundamental mode is used for stabilizing the tip-sample separation. Cycling the bias voltage between two limits, it is possible to observe hysteresis of the second order mode amplitude due to charging. Results are presented on silicon nitride films containing silicon nanocrystals. (c) 2008 American Institute of Physics.

Subject Keywords

Physics and Astronomy (miscellaneous)

URI

https://hdl.handle.net/11511/67536

Journal

APPLIED PHYSICS LETTERS

DOI

https://doi.org/10.1063/1.2888765

Collections

Department of Physics, Article

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Citation Formats

U. Bostanci, M. K. Abak, Ö. AKTAŞ, and A. DANA, “Nanoscale charging hysteresis measurement by multifrequency electrostatic force spectroscopy,” APPLIED PHYSICS LETTERS, pp. 0–0, 2008, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/67536.