Characterization and preparation of thin films and homogeneously precipitated Pb(Zr,Ti)O3 powders Homojen olarak çökelti̇lmi̇ş Pb(Zr,Ti)O3 tozlarin ve i̇nce fi̇lmleri̇n hazirlanmasi ve karakteri̇zasyonu

1999-12-01
In this study, ferroelectric Pb(Zr,Ti)O3 powders and thin films were prepared from metal chlorides using sol-gel processing method. For powders; homogeneous precipitation from aqueous solution and for films; dip coating just before precipitation was applied in the presence of urea, [(NH2)2CO]. Characterization of the films and powders were carried out primarily by XRD and SEM/EDX. Both the films and powders were stoichiometric and completely crystallized into perovskite phase after annealing for 5 hours at 850°C. For annealing temperatures between 350 and 650°C, perovskite, pyrochlore, lead titanate, and for those between 650 and 850°C, pyrochlore and perovskite phases were observed. The PZT powders obtained by using urea had homogeneously distributed, fine particle sizes and morphology. PZT films on platinized silicon substrates obtained by using urea showed remanent polarization and coercive field values as ∼22 μC/cm2 and ∼20 kV/cm from the polarization hysteresis diagram. Dielectric constant of the same films was calculated as 562.
Ulusal Toz Metalurjisi Konferansi: National Powder Metallurgy Conference, (15 - 17 Eylül 1999)

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Citation Formats
A. M. Özenbaş, “Characterization and preparation of thin films and homogeneously precipitated Pb(Zr,Ti)O3 powders Homojen olarak çökelti̇lmi̇ş Pb(Zr,Ti)O3 tozlarin ve i̇nce fi̇lmleri̇n hazirlanmasi ve karakteri̇zasyonu,” Ankara, Türkiye, 1999, p. 375, Accessed: 00, 2021. [Online]. Available: https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=2142646548&origin=inward.