Show/Hide Menu
Hide/Show Apps
Logout
Türkçe
Türkçe
Search
Search
Login
Login
OpenMETU
OpenMETU
About
About
Open Science Policy
Open Science Policy
Open Access Guideline
Open Access Guideline
Postgraduate Thesis Guideline
Postgraduate Thesis Guideline
Communities & Collections
Communities & Collections
Help
Help
Frequently Asked Questions
Frequently Asked Questions
Guides
Guides
Thesis submission
Thesis submission
MS without thesis term project submission
MS without thesis term project submission
Publication submission with DOI
Publication submission with DOI
Publication submission
Publication submission
Supporting Information
Supporting Information
General Information
General Information
Copyright, Embargo and License
Copyright, Embargo and License
Contact us
Contact us
Investigation of Electrical Properties of Cu Ag In Se Thin Films Deposited by Thermal Evaporation Method
Date
2015-09-18
Author
Güllü, Hasan Hüseyin
Coşkun, Emre
Bayraklı, Özge
Parlak, Mehmet
Erçelebi, Ayşe Çiğdem
Metadata
Show full item record
Item Usage Stats
99
views
0
downloads
Cite This
URI
https://hdl.handle.net/11511/74504
Collections
Unverified, Conference / Seminar
Suggestions
OpenMETU
Core
Investigation of structural and optical parameters of Cu-Ag-In-Se thin films deposited by thermal evaporation method
Gullu, H. H.; CANDAN, İDRİS; COŞKUN, EMRE; Parlak, Mehmet (2015-01-01)
Annealing effect on the structural and optical properties of the quaternary Cu-Ag-In-Se thin film deposited by the thermal evaporation has been investigated. The evaporation source was prepared by using vertical Bridgman-Stockbarger crystal growth system. Structural analysis indicated that annealing the films following to the deposition resulted in the changes from amorphous to polycrystalline phase with the preferred orientation along (1 1 2) direction. In order to determine the optical properties of the t...
Investigation of optical parameters of Ag-In-Se thin films deposited by e-beam technique
ÇOLAKOĞLU, TAHİR; Parlak, Mehmet; ÖZDER, SERHAT (Elsevier BV, 2008-07-15)
The optical properties of the Ag-In-Se (AlS) thin films deposited by e-beam technique were investigated by means of the optical transmittance measurements. The optical absorption coefficients of the films were found to vary from 10(3) to 10(5) cm(-1) over the wavelength range of 300-1100 nm. The real and imaginary parts of the refractive index and dielectric constant for the as-grown and annealed films in between 100 and 400 degrees C were evaluated by means of both envelope method (EM) and continuous wavel...
Investigation of thermoluminescence properties of metal oxide doped lithium triborate
Oezdemir, Zeynep; Yılmaz, Ayşen; Yılmaz, Aysun (2007-10-01)
In this study, lithium triborate (LiB3O5) doped with different metal oxides were investigated to explore its thermoluminescence properties. Solid-state reaction method was employed for the synthesis of the desired materials. The formation of the produced phases was confirmed by Powder X-Ray Diffraction (XRD), Infrared (IR), Differential Thermal Analysis (DTA) and Scanning Electron Microscopy (SEM) examinations. It was found that, CuO and Al2O3 doped lithium triborate samples exhibit very significant thermol...
Investigation of electrical characteristics of Ag/ZnO/Si sandwich structure
Gullu, H. H.; Surucu, O. Bayrakli; Terlemezoğlu, Makbule; Yildiz, D. E.; Parlak, Mehmet (Springer Science and Business Media LLC, 2019-08-01)
In this study, temperature-dependent current-voltage (I-V), frequency-dependent capacitance-voltage (C-V) and conductance-voltage (G/omega-V) measurements are carried out for the electrical characterization of a zinc oxide (ZnO) thin film-based diode. The sandwich structure in the form of Ag/ZnO/Si/Al is investigated at temperatures between 220 and 360 K and in the frequency region of 1 kHz-1 MHz. ZnO thin film layer is deposited on a p-Si wafer substrate as a transparent conductive oxide layer by taking in...
Investigation of optical characteristics of PbMoO4 single crystals by spectroscopic ellipsometry
Delice, S.; Isik, M.; Hasanlı, Nızamı; Darvishov, N.H.; Bagiev, V.E. (2022-07-01)
© 2022 Elsevier GmbHIn this study, we investigated the optical properties of PbMoO4 single crystals grown by Czochralski method. Spectroscopic ellipsometry measurements were carried out in the energy region between 1.0 and 5.5 eV at room temperature. X-ray diffraction measurements were achieved for structural characterization. The resulted pattern exhibited one peak belonging to (200) plane. Spectral variations of complex dielectric function, complex refractive index, absorption coefficient and dissipation ...
Citation Formats
IEEE
ACM
APA
CHICAGO
MLA
BibTeX
H. H. Güllü, E. Coşkun, Ö. Bayraklı, M. Parlak, and A. Ç. Erçelebi, “Investigation of Electrical Properties of Cu Ag In Se Thin Films Deposited by Thermal Evaporation Method,” 2015, Accessed: 00, 2021. [Online]. Available: https://hdl.handle.net/11511/74504.