Defect characterization in Bi12GeO20 single crystals by thermoluminescence

Date

2021-05-01

Author

Delice, S.
Isik, M.
Sarıgül, Neslihan
Hasanlı, Nızamı

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Bi12GeO20 single crystal grown by Czochralski method was investigated in terms of thermoluminescence (TL) properties. TL experiments were performed for various heating rates between 1 and 6 K/s in the temperature region of 300-675 K. One TL peak with peak maximum temperature of 557 K was observed in the TL spectrum as constant heating rate of 1 K/s was employed. Curve fitting, initial rise and variable heating rate methods were applied to calculate the activation energy of trap level corresponding to this TL peak. Analyses resulted in a presence of one trap center having mean activation energy of 0.78 eV. Heating rate characteristics of revealed trap center was also explored and theoretically well-known behavior that TL intensity decreases and peak maximum temperature increases with heating rates was observed for the trap level. Distribution of trapping levels was studied by thermally cleaning process for different T-stop between 425 and 525 K. Quasi-continuously distributed trapping levels were revealed with mean activation energies ranging from 0.78 to 1.26 eV. Moreover, absorption analysis revealed an optical transition taking place between a defect level and conduction band with an energy difference of 2.51 eV. These results are in good agreement for the presence of intrinsic defects above valence band in Bi12GeO20 crystals.

Subject Keywords

Sillenites, Defects, Luminescence

URI

https://hdl.handle.net/11511/89909

Journal

JOURNAL OF LUMINESCENCE

DOI

https://doi.org/10.1016/j.jlumin.2021.117905

Collections

Department of Physics, Article

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Citation Formats

S. Delice, M. Isik, N. Sarıgül, and N. Hasanlı, “Defect characterization in Bi12GeO20 single crystals by thermoluminescence,” JOURNAL OF LUMINESCENCE, pp. 0–0, 2021, Accessed: 00, 2021. [Online]. Available: https://hdl.handle.net/11511/89909.