Show/Hide Menu
Hide/Show Apps
Logout
Türkçe
Türkçe
Search
Search
Login
Login
OpenMETU
OpenMETU
About
About
Open Science Policy
Open Science Policy
Open Access Guideline
Open Access Guideline
Postgraduate Thesis Guideline
Postgraduate Thesis Guideline
Communities & Collections
Communities & Collections
Help
Help
Frequently Asked Questions
Frequently Asked Questions
Guides
Guides
Thesis submission
Thesis submission
MS without thesis term project submission
MS without thesis term project submission
Publication submission with DOI
Publication submission with DOI
Publication submission
Publication submission
Supporting Information
Supporting Information
General Information
General Information
Copyright, Embargo and License
Copyright, Embargo and License
Contact us
Contact us
Characterization of Ag/TlInSe2/Ag structure
Date
2011-07-01
Author
QASRAWI, ATEF FAYEZ HASAN
Hasanlı, Nızamı
Metadata
Show full item record
This work is licensed under a
Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License
.
Item Usage Stats
187
views
0
downloads
Cite This
In this work, the current voltage characteristics of Ag/TlInSe2/Ag and In/TlInSe2/In structures, the incident light intensity and time dependencies of photocurrent as well as the response time-illumination intensity dependence of Ag/TlInSe2/Ag structures have been studied. For bias voltages larger than 1200. and 4.0 V, the current injection was found to be space charge limited and was assigned to the existing of deep and shallow hole traps being located at 210 and 16 meV for Ag and In-contacted samples, respectively. While indium-contacted samples show S-shaped I-V dependence above bias voltage of 10.0V, silver contacted samples does not show this behavior even at 200.0 V. For the Ag/TlInSe2/Ag structure, photocurrent was observed to exhibit stable values in a very short period of time. The device response time decreases with increasing illumination intensity, it exhibits a value of 0.13 s at incident light intensity of 53.6 mW cm(-2). The decrement in response time with increasing illumination intensity is associated with an increment in photocurrent at the same ratio. The ohmic behavior up to high voltages (120 V), the fast response time and the large spatial photocurrent make the Ag/TlInSe2/Ag structure promising IR detectors. (C) 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Subject Keywords
Electrical and Electronic Engineering
,
Materials Chemistry
,
Electronic, Optical and Magnetic Materials
,
Surfaces, Coatings and Films
,
Surfaces and Interfaces
,
Condensed Matter Physics
URI
https://hdl.handle.net/11511/41462
Journal
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
DOI
https://doi.org/10.1002/pssa.201026539
Collections
Department of Physics, Article
Suggestions
OpenMETU
Core
Transport and recombination kinetics in TlGaTe2 crystals
QASRAWI, ATEF FAYEZ HASAN; Hasanlı, Nızamı (Wiley, 2009-11-01)
In this work, the transport and recombination mechanisms as well as the average hole-relaxation time in TlGaTe2 have been investigated by means of temperature-dependent dark electrical conductivity, photoexcitation intensity-dependent photoconductivity, and Hall effect measurements, respectively. The experimental data analysis revealed the existence of a critical temperature of 150 K. At this temperature, the transport mechanism is disturbed. The dark conductivity data analysis allowed the determination of ...
Determination of carrier effective mass, impurity energy levels, and compensation ratio in Ga4Se3S layered crystals by Hall effect measurements
QASRAWI, ATEF FAYEZ HASAN; Hasanlı, Nızamı (Wiley, 2008-07-01)
In this work, the dark electrical resistivity, charge carriers density and Hall mobility of Ga4Se3S single crystals have been measured and analyzed in the temperature region of 200-350 K. The data analyses have shown that this crystal exhibits an extrinsic n-type of conduction. The temperature-dependent dark electrical resistivity analysis reflected the existence of energy level as 0.31 eV. The temperature dependence of carrier density was analyzed by using the single donor-single acceptor model. The latter...
Characterization by Fourier transform infrared spectroscopy of hydroxyapatite co-doped with zinc and fluoride
Uysal, I.; Severcan, F.; Evis, Zafer (Elsevier BV, 2013-09-01)
Pure and Zn2+ and/or F- doped hydroxyapatite (HA) were synthesized by the precipitation method and detection of ion incorporations into the HA structure was investigated by a non invasive Fourier transform infrared (FAR) spectroscopic technique. The synthesized materials were sintered at 1100 degrees C for 1 h. The Zn2+ addition amount was kept constant at 2 mol% whereas F- amount was changed. The weight fractions of the HA and CaO were calculated by Rietveld analysis by using GSAS. Co-doping of Zn2+ and F-...
Analysis of the Spontaneous Polarization and the Dielectric Constant Near the Ferroelectric Phase Transition in TSCC
Yurtseven, Hasan Hamit (Informa UK Limited, 2008-01-01)
The temperature dependence of the spontaneous polarization and the dielectric constant has been analyzed for the fixed pressures of 0.001,1 and 2.2 kbar close to the phase transitions in TSCC. This analysis is performed using the experimental data for TSCC according to a power-law formula. From our analysis, using the experimental data for the spontaneous polarization, we deduce the values of the critical exponent = 0.32 (1 bar), 0.28 (1 kbar) and 0.26 (2.2 kbar) for the spontaneous polarization near the tr...
Characteristics of HfO2 and SiO2 on p-type silicon wafers using terahertz spectroscopy
Altan, Hakan; Pham, D.; Grebel, H.; Federici, J. F. (IOP Publishing, 2007-05-01)
The effect of high-kappa dielectric HfO2 films on 200 mm diameter p-type silicon substrates was investigated and compared with conventional dielectric material, SiO2. We employed all-optical characterization methods using terahertz (THz) time-domain spectroscopy and visible cw pump/THz probe spectroscopy. Measurements were performed on two sets of samples, each set containing both HfO2 and SiO2 coated wafers with varying thickness of oxide layer. One set had a protective coating of either photoresist or Si3...
Citation Formats
IEEE
ACM
APA
CHICAGO
MLA
BibTeX
A. F. H. QASRAWI and N. Hasanlı, “Characterization of Ag/TlInSe2/Ag structure,”
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
, pp. 1688–1692, 2011, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/41462.