Optical constants of layered structured Ga0.75In0.25Se crystals from the ellipsometric measurements

2012-05-01
IŞIK, MEHMET
ÇETİN, ŞABAN
Hasanlı, Nızamı
ÖZÇELİK, SÜLEYMAN
We have carried out the spectroscopic ellipsometry measurements on Ga0.75In0.25Se single crystals in the 1.2-6.0 eV spectral range at room temperature. The optical constants, real and imaginary parts of the dielectric function, refractive index and extinction coefficient, were found as a result of analysis of ellipsometric data. The critical point analysis of the second derivative spectra of the dielectric function revealed four interband transition structures with critical point energy values of 3.19, 3.53, 4.10 and 4.98 eV. The results of the analysis were compared with those of the ellipsometric studies performed on GaSe which is the main constituent of the Ga0.75In0.25Se crystal. The obtained critical point energies are in good agreement with the energies of the GaSe crystal reported in the literature.
SOLID STATE COMMUNICATIONS

Suggestions

Optical properties of TlGaxIn1-xSe2-layered mixed crystals (0.5 <= x <= 1) by spectroscopic ellipsometry, transmission, and reflection
IŞIK, MEHMET; Delice, S.; Hasanlı, Nızamı (2014-01-01)
The layered semiconducting TlGaxIn1-xSe2-mixed crystals (0.5 <= x <= 1) were studied for the first time by spectroscopic ellipsometry measurements in the 1.2-6.2 eV spectral range at room temperature. The spectral dependence of the components of the complex dielectric function, refractive index, and extinction coefficient were revealed using an optical model. The interband transition energies in the studied samples were found from the analysis of the second-energy derivative spectra of the complex dielectri...
Interband critical points in TlGaxIn1-xS2 layered mixed crystals (0 <= x <= 1)
IŞIK, MEHMET; Hasanlı, Nızamı (2013-12-25)
The layered semiconducting TlGaxIn1-xS2 mixed crystals (0 <= x <= 1) were studied by spectroscopic ellipsometry measurements in the 1.2-6.2 eV spectral range at room temperature. The spectral dependence of the components of the complex dielectric function, refractive index and extinction coefficient were revealed using an optical model. The interband transition energies in the studied samples were found from the analysis of the second-energy derivative spectra of the complex dielectric function. The variati...
Ellipsometry study of interband transitions in TlGaS2xSe2(1-x) mixed crystals (0 <= x <= 1)
IŞIK, MEHMET; Hasanlı, Nızamı (2012-09-15)
In this paper, the spectroscopic ellipsometry measurements on TlGaS2xSe2(1 - x) mixed crystals (0 <= x <= 1) were carried out on the layer-plane (001) surfaces with light polarization E perpendicular to c* in the 1.2-6.2 eV spectral range at room temperature. The real and imaginary parts of the dielectric function, refractive index and extinction coefficient were calculated from ellipsometric data using the ambient-substrate optical model. The critical point energies in the above-band gap energy range have ...
Optical properties of Cu3In5S9 single crystals by spectroscopic ellipsometry
Işık, Mehmet; Nasser, H.; Ahmedova, F.; Guseinov, A.; Hasanlı, Nızamı (2018-01-01)
Cu3In5S9 single crystals were investigated by structural methods of x-ray diffraction and energy dispersive spectroscopy and optical techniques of ellipsometry and reflection carried out at room temperature. The spectral dependencies of optical constants; dielectric function, refractive index and extinction coefficient, were plotted in the range of 1.2-6.2 eV from ellipsometric data. The spectra of optical constants obtained from ellipsometry analyses and reflectance spectra presented a sharp change around ...
Spectroscopic ellipsometry study of above-band gap optical constants of layered structured TlGaSe2, TlGaS2 and TlInS2 single crystals
IŞIK, MEHMET; Hasanlı, Nızamı; Turan, Raşit (2012-11-01)
Spectroscopic ellipsometry measurements on TlGaSe2, TlGaS2 and TlInS2 layered crystals were carried out on the layer-plane (0 0 1) surfaces, which are perpendicular to the optic axis c*, in the 1.2- 6.2 eV spectral range at room temperature. The real and imaginary parts of the pseudodielectric function as well as pseudorefractive index and pseudoextinction coefficient were found as a result of analysis of ellipsometric data. The structures of critical points in the above-band gap energy range have been char...
Citation Formats
M. IŞIK, Ş. ÇETİN, N. Hasanlı, and S. ÖZÇELİK, “Optical constants of layered structured Ga0.75In0.25Se crystals from the ellipsometric measurements,” SOLID STATE COMMUNICATIONS, pp. 791–793, 2012, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/45879.