PVD growth and characterization of YBCO thin films on polycrystalline alumina substrates: phase separation

2000-11-01
Ozenbas, MA
Gungoren, T
In this study, high T-c superconducting thin films of Y-Ba-Cu-O system have been prepared onto polycrystalline alpha -Al2O3 substrates by resistive evaporation of YF3, BaF2, and Cu powders and a subsequent multi-stage annealing. In the deposition process, two different methods were used: mixed-powder method and sequential-deposition method. The best quality films were achieved on alpha -Al2O3 substrates by using sequential-deposition technique with offset critical transition temperature of 80.6 K. Sequential deposition method seems to reduce film-substrate reactions on alpha -Al2O3 substrates, probably due in part to the prevention of phase separation.
Citation Formats
M. Ozenbas and T. Gungoren, “PVD growth and characterization of YBCO thin films on polycrystalline alumina substrates: phase separation,” PHYSICA C, vol. 341, pp. 2363–2364, 2000, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/65420.