PVD growth and characterization of YBCO thin films on polycrystalline alumina substrates: phase separation

Date

2000-11-01

Author

Ozenbas, MA
Gungoren, T

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In this study, high T-c superconducting thin films of Y-Ba-Cu-O system have been prepared onto polycrystalline alpha -Al2O3 substrates by resistive evaporation of YF3, BaF2, and Cu powders and a subsequent multi-stage annealing. In the deposition process, two different methods were used: mixed-powder method and sequential-deposition method. The best quality films were achieved on alpha -Al2O3 substrates by using sequential-deposition technique with offset critical transition temperature of 80.6 K. Sequential deposition method seems to reduce film-substrate reactions on alpha -Al2O3 substrates, probably due in part to the prevention of phase separation.

Subject Keywords

Electrical and Electronic Engineering, Energy Engineering and Power Technology, Electronic, Optical and Magnetic Materials, Condensed Matter Physics

URI

https://hdl.handle.net/11511/65420

Journal

PHYSICA C

DOI

https://doi.org/10.1016/s0921-4534(00)01256-9

Collections

Department of Metallurgical and Materials Engineering, Article

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Citation Formats

M. Ozenbas and T. Gungoren, “PVD growth and characterization of YBCO thin films on polycrystalline alumina substrates: phase separation,” PHYSICA C, pp. 2363–2364, 2000, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/65420.