Show/Hide Menu
Hide/Show Apps
anonymousUser
Logout
Türkçe
Türkçe
Search
Search
Login
Login
OpenMETU
OpenMETU
About
About
Açık Bilim Politikası
Açık Bilim Politikası
Frequently Asked Questions
Frequently Asked Questions
Browse
Browse
By Issue Date
By Issue Date
Authors
Authors
Titles
Titles
Subjects
Subjects
Communities & Collections
Communities & Collections
Investigations of thermal annealing role on the optical properties of Zn-In-Se thin films
Date
2017-01-01
Author
Gullu, H. H.
COŞKUN, EMRE
Parlak, Mehmet
Metadata
Show full item record
This work is licensed under a
Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License
.
Item Usage Stats
1
views
0
downloads
Zn-In-Se (ZIS) thin films were prepared by sequential evaporation of its elemental sources on the glass substrates. The effect of thermal annealing under nitrogen environment on the optical properties of the films was discussed. In addition to the comparative study of three different annealing temperatures, the results were analyzed by relating with their structural and compositional characteristics. The optical analyses were based on the observed interference fringes on their transmission spectra of the films. The refractive indices were calculated by means of envelope method (EM) and the continuity of the refractive indices was evaluated by three-term Cauchy fitting process. From the results of the refractive index calculations, the real and imaginary part of the dielectric constant were determined. The optical absorption coefficients of the films were found in the range of 10(3)-10(4) cm(-1) over the visible and near-infrared region and by using these values, the extinction coefficients were calculated. Moreover, the band gap values were calculated from the corresponding Tauc plots, and the refractive index dispersion over the measured wavelength range was investigated with single-oscillator model (SOM) and the related parameters were obtained. (C) 2017 Elsevier GmbH. All rights reserved.
Subject Keywords
Electrical and Electronic Engineering
,
Atomic and Molecular Physics, and Optics
,
Electronic, Optical and Magnetic Materials
URI
https://hdl.handle.net/11511/42614
Journal
OPTIK
DOI
https://doi.org/10.1016/j.ijleo.2017.06.106
Collections
Department of Physics, Article